Works title
VLSI testing - memory test
Authors
[ 1 ] Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ P ] employee
Work ID
r1869_2021
Keywords
PL
- VLSI test
- memory test
- memory fault models
- memory built-in self-test
Date
04.05.2021
Language
english
Number of pages or volume of work
47
Type of work
educational materials
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