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Outcome

Title

Sposób bezstykowego pomiaru odchyłki kształtu metodą interferometryczną

Creators

[ 1 ] Instytut Technologii Mechanicznej, Wydział Inżynierii Mechanicznej, Politechnika Poznańska | [ P ] employee

Scientific discipline (Law 2.0)

[2.8] Mechanical engineering

Type of protection law

invention

Submission, granting and maintenance of protection

Outcome protection

Polska

Submission to the Patent Office

Patent Office submission number

405952

Patent office submission date

07.11.2013

Country / region

Polska

Granting and maintaining protection

Protection law number

226387

Date of obtaining the right

02.01.2017

Country / region

Polska

Made public

Wiadomości Urzędu Patentowego

Number

07/17

Made public date

31.07.2017

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