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Book

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Title

17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, Warsaw, Poland, 23-25 April 2014

Year of publication

2014

Publisher name

IEEE

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2014

ISBN

978-1-4799-4560-3

Chapters
Quality assurance in memory built-in self-test tools (p. 39-44)
Conference

17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 23-25.04.2014, Warsaw, Poland

Publication indexed in

WoS (15)

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