Title
IEEE International Test Conference (ITC), Anaheim, CA, 6-8 October 2015
Year of publication
2015
Book type
edited book
Publication language
english
Publisher name
Publisher name from the Ministry list
Institute of Electrical and Electronics Engineers (IEEE)
Date of publication
2015
ISBN
978-1-4673-6578-9
Published in
Book series: International Test Conference Proceedings
Publication indexed in
WoS (15)
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