Depending on the amount of data to process, file generation may take longer.

If it takes too long to generate, you can limit the data by, for example, reducing the range of years.

Chapter

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Title

Embedded deterministic test points for compact cell-aware tests

Authors

[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ 2 ] Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee

Year of publication

2015

Chapter type

paper

Publication language

english

Pages (from - to)

1 - 8

DOI

10.1109/TEST.2015.7342383

Book

IEEE International Test Conference (ITC), Anaheim, CA, 6-8 October 2015

Presented on

46th IEEE International Test Conference (ITC), 6-8.10.2015, Anaheim, CA, United States

Publication indexed in

WoS (15)

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