SIS PUT | iss. 1-2 | vol. 527 | 2002 | Journal of Electroanalytical Chemistry

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Main page / Journals / Journal of Electroanalytical Chemistry / 2002 / vol. 527 / iss. 1-2

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Journal: Journal of Electroanalytical Chemistry | Journal year: 2002 | Journal volume: vol. 527

Number iss. 1-2

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https://www.sciencedirect.com/journal/journal-of-electroanalytical-chemistry/vol/527/issue/1

1.

Mechanism of initial structure formation on highly doped n-Si(111) / Helmut Jungblut, Jarosław Jakubowicz (WBMiZ), Stefan L. Schweizer, Hans Joachim Lewerenz // Journal of Electroanalytical Chemistry - 2002, vol. 527, iss. 1-2, p. 41-46

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