Depending on the amount of data to process, file generation may take longer.

If it takes too long to generate, you can limit the data by, for example, reducing the range of years.

Book

Download BibTeX

Title

IEEE International Test Conference (ITC 2013), Anaheim, CA, 6-13 September, 2013

Year of publication

2013

Book type

edited book

Publisher name

IEEE

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2013

ISBN

978-1-4799-0859-2

DOI

10.1109/ITC30169.2013

URL

https://ieeexplore.ieee.org/xpl/conhome/6646057/proceeding

Chapters
Fault diagnosis of TSV-based interconnects in 3-D stacked designs (p. 1-9)
EDT bandwidth management - Practical scenarios for large SoC designs (p. 1-10)
Conference

IEEE International Test Conference (ITC 2013), 6-13.09.2013, Anaheim, United States

Publication indexed in

WoS (15)

This website uses cookies to remember the authenticated session of the user. For more information, read about Cookies and Privacy Policy.