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Book

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Title

IEEE 23rd Asian Test Symposium (ATS), 2014, Hangzhou, 16-19 Nov. 2014

Year of publication

2014

Book type

edited book

Publication language

english

Publisher name

IEEE

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2014

ISBN

978-1-4799-6030-9

DOI

10.1109/ATS34053.2014

URL

https://ieeexplore.ieee.org/xpl/conhome/6975725/proceeding

Chapters
High-speed serial embedded deterministic test for system-on-chip designs (p. 74-80)
Low Power Test Compression with Programmable Broadcast-Based Control (p. 174-179)
Conference

IEEE 23rd Asian Test Symposium (ATS), 2014, 16-19.11.2014, Hangzhou, China

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