Title
High-speed serial embedded deterministic test for system-on-chip designs
Authors
[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee
Year of publication
2014
Chapter type
paper
Publication language
english
Abstract
EN The paper presents a high-speed serial interface between external tester and Embedded Deterministic Test (EDT) compression logic hosted by SoC designs. With only a single bidirectional link, the system is capable of feeding distributed heterogeneous cores with hundreds of test channels. Moreover, it synergistically supports EDT bandwidth management to improve the overall test performance. A detailed study indicates a high potential of the serial EDT approach to handle large multicore SoC designs by deploying only a single serial interface and completing the entire test for stuck-at faults in less than one second. Experiments conducted with the help of FPGA -- based evaluation platform confirm feasibility and a high effectiveness of the proposed solution.
Pages (from - to)
74 - 80
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