Depending on the amount of data to process, file generation may take longer.

If it takes too long to generate, you can limit the data by, for example, reducing the range of years.

Chapter

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Title

High-speed serial embedded deterministic test for system-on-chip designs

Authors

[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee

Year of publication

2014

Chapter type

paper

Publication language

english

Pages (from - to)

74 - 80

DOI

10.1109/ATS.2014.25

Book

IEEE 23rd Asian Test Symposium (ATS), 2014, Hangzhou, 16-19 Nov. 2014

Presented on

IEEE 23rd Asian Test Symposium (ATS), 2014, 16-19.11.2014, Hangzhou, China

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