Depending on the amount of data to process, file generation may take longer.

If it takes too long to generate, you can limit the data by, for example, reducing the range of years.

Article

Download BibTeX

Title

Basic characteristics of IEC flickermeter processing

Authors

[ 1 ] Katedra Sterowania i Inżynierii Systemów (KI), Wydział Informatyki i Zarządzania, Politechnika Poznańska | [ 2 ] Instytut Elektrotechniki i Elektroniki Przemysłowej, Wydział Elektryczny, Politechnika Poznańska | [ P ] employee

Year of publication

2012

Published in

Modelling & Simulation in Engineering

Journal year: 2012 | Journal volume: vol. 2012

Article type

scientific article

Publication language

english

Pages (from - to)

362849-1 - 362849-9

DOI

10.1155/2012/362849

This website uses cookies to remember the authenticated session of the user. For more information, read about Cookies and Privacy Policy.