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Book

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Title

IEEE International Test Conference (ITC) 2020

Year of publication

2020

Book type

scientific monograph / conference proceedings

Publication language

english

Publisher name

IEEE

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2020

Number of pages

300

ISBN

978-1-7281-9114-0

eISBN

978-1-7281-9113-3

URL

https://ieeexplore.ieee.org/xpl/conhome/9325188/proceeding

Chapters
X-Tolerant Tunable Compactor for In-System Test
Conference

IEEE International Test Conference (ITC), 1-6.11.2020, Washington, United States

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