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Chapter


Title

X-Tolerant Tunable Compactor for In-System Test

Authors

[ 1 ] Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ 2 ] Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ P ] employee | [ SzD ] doctoral school student

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

Year of publication

2020

Chapter type

chapter in monograph / paper

Publication language

english

Keywords
EN
  • built-in self-test
  • embedded-test
  • scan-based testing
  • test application time
  • unknown states
  • X-masking
DOI

10.1109/ITC44778.2020.9325266

URL

https://ieeexplore.ieee.org

Book

IEEE International Test Conference (ITC) 2020

Presented on

IEEE International Test Conference (ITC), 1-6.11.2020, Washington, United States

Points of MNiSW / chapter

20.0

Points of MNiSW / conference (CORE)

70.0