X-Tolerant Tunable Compactor for In-System Test

Yingdi Liu; Sylwester Milewski; Grzegorz Mrugalski; Nilanjan Mukherje; Janusz Rajski; Jerzy Tyszer; Bartosz Włodarczak

doi:10.1109/ITC44778.2020.9325266

Scientific Information System of the Poznań University of Technology

PL EN

Main page / Publications / X-Tolerant Tunable Compactor for In-System Test

Submit a comment

Chapter

Download BibTeX

Title

X-Tolerant Tunable Compactor for In-System Test

Authors

Yingdi Liu
Sylwester Milewski
Grzegorz Mrugalski
Nilanjan Mukherje
Janusz Rajski
Jerzy Tyszer (WIiT) ^{[ 1 ][ 2.3 ][ P ]}
Bartosz Włodarczak (WIiT) ^{[ 2 ][ 2.3 ][ SzD ]}

^{[ 1 ]} Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | ^{[ 2 ]} Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | ^{[ P ]} employee | ^{[ SzD ]} doctoral school student

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

Year of publication

2020

Chapter type

chapter in monograph / paper

Publication language

english

Keywords

EN

DOI

10.1109/ITC44778.2020.9325266

URL

https://ieeexplore.ieee.org

Book

IEEE International Test Conference (ITC) 2020

Presented on

51st IEEE International Test Conference, ITC 2020, 1-6.11.2020, Washington, United States

Ministry points / chapter

20

Ministry points / conference (CORE)

70

System created by Poznań University of Technology and Poznan Supercomputing and Networking Center

Log in through eKonto to add to SIS