X-Tolerant Tunable Compactor for In-System Test

Yingdi Liu; Sylwester Milewski; Grzegorz Mrugalski; Nilanjan Mukherje; Janusz Rajski; Jerzy Tyszer; Bartosz Włodarczak

doi:10.1109/ITC44778.2020.9325266

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Title

X-Tolerant Tunable Compactor for In-System Test

Authors

Yingdi Liu
Sylwester Milewski
Grzegorz Mrugalski
Nilanjan Mukherje
Janusz Rajski
Jerzy Tyszer (WIiT) ^{[ 1 ][ 2.3 ][ P ]}
Bartosz Włodarczak (WIiT) ^{[ 2 ][ 2.3 ][ SzD ]}

^{[ 1 ]} Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | ^{[ 2 ]} Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | ^{[ P ]} employee | ^{[ SzD ]} doctoral school student

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

Year of publication

2020

Chapter type

chapter in monograph / paper

Publication language

english

Keywords

EN

built-in self-test
embedded-test
scan-based testing
test application time
unknown states
X-masking

DOI

10.1109/ITC44778.2020.9325266

URL

https://ieeexplore.ieee.org

Book

IEEE International Test Conference (ITC) 2020

Presented on

IEEE International Test Conference (ITC), 1-6.11.2020, Washington, United States

Ministry points / chapter

20

Ministry points / conference (CORE)

70

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