The Influence of Noise Level on the Value of Uncertainty in a Measurement System Containing an Analog-to-Digital Converter
[ 1 ] Instytut Elektrotechniki i Elektroniki Przemysłowej, Wydział Automatyki, Robotyki i Elektrotechniki, Politechnika Poznańska | [ P ] employee
[2.2] Automation, electronics, electrical engineering and space technology
2023
scientific article
english
- expanded uncertainty
- DAQ devices
- analog-to-digital converter
- ADC
- electromagnetic interference
- maximum permissible error
- experimental standard deviation
- experimental standard deviation of the mean
- probability distribution
- LabVIEW
18.01.2023
1060-1 - 1060-20
Article number: 1060
public
140
3