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Article

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Title

Practical Verification of Diagnostic Capabilities of Methods for the Recreation of Voltage Fluctuations

Authors

[ 1 ] Instytut Elektrotechniki i Elektroniki Przemysłowej, Wydział Automatyki, Robotyki i Elektrotechniki, Politechnika Poznańska | [ P ] employee

Scientific discipline (Law 2.0)

[2.2] Automation, electronics, electrical engineering and space technologies

Year of publication

2024

Published in

Electronics

Journal year: 2024 | Journal volume: vol. 13 | Journal number: iss. 16

Article type

scientific article

Publication language

english

Keywords
EN
  • flicker
  • power quality
  • recreation of voltage fluctuation
  • voltage fluctuation
  • voltage fluctuation indices
  • voltage variation
Abstract

EN Voltage fluctuations are one of the most common problems in low-voltage networks. Very often, these disturbances cause damage to or the incorrect operation of electrical devices. Unfortunately, at present, the monitoring of these disturbances relies on short-term and long-term flicker indicators, which only assess the severity of one of the effects of voltage fluctuations. Another measure of voltage fluctuations that has greater diagnostic potential is voltage fluctuation indices, i.e., the amplitude and rate of voltage fluctuations. One advantage of these indices that has been highlighted in recent years is their potential ability to recreate voltage fluctuations using these indices. This article presents research results that allow for the verification of the potential of voltage fluctuation indices as a method for recreating voltage fluctuations. For verification purposes, various cases of voltage variation recorded in a modern low-voltage network are used. The analysis of the possibility of recreating voltage fluctuations from voltage fluctuation indices presented in this article, in association with previously carried out numerical simulation studies and experimental laboratory studies, constitutes a complementary whole and indicates further directions in voltage fluctuation research in terms of the electromagnetic compatibility of low-frequency conducted disturbances.

Pages (from - to)

3272-1 - 3272-19

DOI

10.3390/electronics13163272

URL

https://www.mdpi.com/2079-9292/13/16/3272

Comments

Article number: 3272

License type

CC BY (attribution alone)

Open Access Mode

open journal

Open Access Text Version

final published version

Date of Open Access to the publication

at the time of publication

Full text of article

Download file

Access level to full text

public

Ministry points / journal

100

Impact Factor

2,6 [List 2023]

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