Works title
VLSI testing – Fault simulation
Authors
[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee
Work ID
r559958_2019
Keywords
EN
- test generation
- design for testability
Date
17.06.2019
Language
english
Number of pages or volume of work
30
Type of work
educational materials
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