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Person from outside the Poznań University of Technology

All publications

Articles | Chapters | IP outcomes

1.

X-Tolerant Compactor maXpress for In-System Test Applications with Observation Scan / Yingdi Liu, Sylwester Milewski (WIiT), Grzegorz Mrugalski, Nilanjan Mukherje, Janusz Rajski, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // IEEE Transactions on Very Large Scale Integration (VLSI) Systems - 2021, vol. 29, no. 8, p. 1553-1566

Scientific article 100

1.

X-Tolerant Tunable Compactor for In-System Test / Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherje, Janusz Rajski, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // W: IEEE International Test Conference (ITC) 2020: IEEE, 2020

Chapter in monograph / paper 20 70
2.

Minimal area test points for deterministic patterns / Yingdi Liu, Elham Moghaddam, Nilanjan Mukherje, Sudhakar M. Reddy, Janusz Rajski, Jerzy Tyszer (WEiT) // W: 2016 IEEE International Test Conference (ITC): IEEE, 2016 - p. 1-7

Paper

1.

Test Application Time Reduction Using Capture-Per-Cycle Test Points / Janusz Rajski, Sylwester Milewski, Nilanjan Mukherje, Jędrzej Solecki, Jerzy Tyszer (WIiT), Justyna Zawada // 0100

Invention
2.

Continuous application and decompression of test patterns and selective compaction of test responses / Janusz Rajski, Jerzy Tyszer (WIiT), Mark Kassab, Nilanjan Mukherje // 0104

Invention
3.

Test point insertion for low test pattern count / Janusz Rajski, Elham Moghaddam, Nilanjan Mukherje, Jerzy Tyszer (WIiT), Justyna Zawada // 0101

Invention
4.

Continuous application and decompression of test patterns and selective compaction of test responses / Jerzy Tyszer (WIiT), Janusz Rajski, Mark Kassab, Nilanjan Mukherje // Z/15/2025

Invention
5.

Test Scheduling and Test Access in Test Compression Environment / Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherje, Janusz Rajski, Jakub Janicki, Jerzy Tyszer (WIiT) // 0118

Invention