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Article


Title

X-Tolerant Compactor maXpress for In-System Test Applications with Observation Scan

Authors

[ 1 ] Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ 2 ] Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ D ] phd student | [ P ] employee | [ SzD ] doctoral school student

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

Year of publication

2021

Published in

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Journal year: 2021 | Journal volume: vol. 29 | Journal number: no. 8

Article type

scientific article

Publication language

english

Keywords
EN
  • built-in self-test (BIST)
  • embedded-test
  • scan-based testing
  • test application time
  • unknown states
  • X-masking
Pages (from - to)

1553 - 1566

DOI

10.1109/TVLSI.2021.3092421

URL

https://ieeexplore.ieee.org

Points of MNiSW / journal

100.0

Points of MNiSW / journal in years 2017-2021

100.0

Impact Factor

2.312 [List 2020]