Depending on the amount of data to process, file generation may take longer.

If it takes too long to generate, you can limit the data by, for example, reducing the range of years.

Book

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Title

IEEE 23rd Asian Test Symposium (ATS), 2014, Hangzhou, 16-19 Nov. 2014

Year of publication

2014

Publisher name

IEEE

Publisher name from the Ministry list

Institute of Electrical and Electronics Engineers (IEEE)

Date of publication

2014

ISBN

978-1-4799-6030-9

Chapters
High-speed serial embedded deterministic test for system-on-chip designs (p. 74-80)
Low Power Test Compression with Programmable Broadcast-Based Control (p. 174-179)
Conference

IEEE 23rd Asian Test Symposium (ATS), 2014, 16-19.11.2014, Hangzhou, China

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