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Former employee of the Poznań University of Technology

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Janusz Rajski

Articles | Chapters | Dissertation | Doctoral supervisor of doctoral dissertations | IP outcomes

1.

Autonomous Scan Patterns for Laser Voltage Imaging / Jerzy Tyszer (WIiT), Wu-Tung Cheng, Sylwester Milewski (WIiT), Grzegorz Mrugalski, Janusz Rajski, Maciej Trawka // IEEE Transactions on Emerging Topics in Computing - 2021, vol. 9, no. 2, p. 680-691

Scientific article 140.0 7.691
2.

Time and Area Optimized Testing of Automotive ICs / Nilanjan Mukherjee, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski (WIiT), Elham Moghaddam, Janusz Rajski, Jędrzej Solecki, Jerzy Tyszer (WIiT) // IEEE Transactions on Very Large Scale Integration (VLSI) Systems - 2021, vol. 29, no. 1, p. 76-88

Scientific article 100.0 2.312
3.

X-Tolerant Compactor maXpress for In-System Test Applications with Observation Scan / Yingdi Liu, Sylwester Milewski (WIiT), Grzegorz Mrugalski, Nilanjan Mukherje, Janusz Rajski, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // IEEE Transactions on Very Large Scale Integration (VLSI) Systems - 2021, vol. 29, no. 8, p. 1553-1566

Scientific article 100.0 2.312
4.

Deterministic Stellar BIST for Automotive ICs / Yingdi Liu, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer (WIiT) // IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems - 2020, vol. 39, no. 8, p. 1699-1710

Scientific article 100.0 2.807
5.

Low Cost Hypercompression of Test Data / Yu Huang, Sylwester Milewski (WIiT), Janusz Rajski, Jerzy Tyszer (WIiT), Chen Wang // IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems - 2020, vol. 39, no. 10, p. 2964-2975

Scientific article 100.0 2.807

All articles

1.

Convolutional Compaction-Based MRAM Fault Diagnosis / Bartosz Grzelak (WIiT), Martin Keim, Artur Pogiel, Janusz Rajski, Jerzy Tyszer (WIiT) // W: IEEE European Test Symposium (ETS) 2021: IEEE, 2021

Chapter in monograph / paper 20.0
2.

On Reduction of Deterministic Test Pattern Sets / Stephan Eggersglüß, Sylwester Milewski (WIiT), Janusz Rajski, Jerzy Tyszer (WIiT) // W: Proceedings of the IEEE International Test Conference 2021: IEEE, 2021 - p. 260-267

Chapter in monograph / paper 20.0
3.

Test Sequence-Optimized BIST for Automotive Applications / Bartosz Kaczmarek, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Łukasz Rybak, Jerzy Tyszer (WIiT) // W: IEEE European Test Symposium (ETS) 2020: IEEE, 2020

Chapter in monograph / paper 20.0
4.

X-Tolerant Tunable Compactor for In-System Test / Yingdi Liu, Sylwester Milewski, Grzegorz Mrugalski, Nilanjan Mukherje, Janusz Rajski, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // W: IEEE International Test Conference (ITC) 2020: IEEE, 2020

Chapter in monograph / paper 20.0 70.0
5.

On cyclic scan integrity tests for EDT-based compression / Wu-Tung Cheng, Grzegorz Mrugalski, Janusz Rajski, Maciej Trawka, Jerzy Tyszer (WEiT) // W: IEEE 37th VLSI Test Symposium (VTS 2019): IEEE, 2019

Chapter in monograph / paper 20.0

All chapters

1.

Metoda automatycznej generacji sekwencji testujących układy cyfrowe uwzględniająca konstrukcję podzespołu elektronicznego / Janusz Rajski / prom. Zbigniew Kierzkowski, rev. Zdzisław Kachlicki (WE), Krzysztof Sapiecha - Poznań, Polska, 1982 - 108 s.

Dissertation

1.

Test compression bandwidth management in system-on-a-chip designs / Jakub Remigiusz Janicki (WEiT) / prom. Jerzy Tyszer (WEiT), Janusz Rajski, rev. Krishnendu Chakrabarty, Andrzej Kraśniewski - Poznań, Polska, 2014 - 116 s.

Dissertation
2.

Low Power Test Application with Selective Compaction in VLSI Designs / Dariusz Czysz (WEiT) / prom. Jerzy Tyszer (WEiT), Janusz Rajski, rev. Marek Domański (WEiT), Hans-Joachim Wunderlich, Andrzej Kraśniewski - Poznań, Polska, 2010 - 133 s.

Dissertation
3.

Fault Diagnosis in Design with Convolutional Compactors / Artur Pogiel / prom. Janusz Rajski, Jerzy Tyszer (WEiT), rev. Sybille Hellebrand, Andrzej Kraśniewski, Krzysztof Wesołowski (WEiT) - Poznań, Polska, 2008 - 101 s.

Dissertation

All dissertations

1.

Test Application Time Reduction Using Capture-Per-Cycle Test Points / Janusz Rajski, Sylwester Milewski, Nilanjan Mukherje, Jędrzej Solecki, Jerzy Tyszer (WIiT), Justyna Zawada // 0100

Invention
2.

MULTI-STAGE TEST RESPONSE COMPACTORS / Jerzy Tyszer (WIiT), Janusz Rajski, Grzegorz Mrugalski, Mark Kassab, Wu-Tung Cheng // 0057

Invention
3.

Continuous application and decompression of test patterns and selective compaction of test responses / Janusz Rajski, Jerzy Tyszer (WIiT), Mark Kassab, Nilanjan Mukherje // 0104

Invention
4.

Test Point-Enhanced Hardware Security / Janusz Rajski, Nilanjan Mukherjee, Elham Moghaddam, Jerzy Tyszer (WIiT), Justyna Zawada // 010

Invention
5.

Deterministic Built-In Self-Test / Grzegorz Mrugalski, Janusz Rajski, Łukasz Rybak, Jędrzej Solecki, Jerzy Tyszer (WIiT) // 0085

Invention

All outcomes

System created by Poznań University of Technology and Poznan Supercomputing and Networking Center

Scientific Information System of the Poznań University of Technology

Former employee of the Poznań University of Technology

Janusz Rajski

Articles (19)

Chapters (27)

Dissertation

Doctoral supervisor of doctoral dissertations (3)

IP outcomes (10)