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Former employee of the Poznań University of Technology

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Janusz Rajski

Articles | Chapters | Dissertation | Doctoral supervisor of doctoral dissertations | IP outcomes

1.

A Lightweight True Random Number Generator for Root of Trust Applications / Janusz Rajski, Maciej Trawka, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - 2023, vol. 42, iss. 9, p. 2815-2825

Scientific article 100.0 2.9
2.

A new static compaction of deterministic test sets / Stephan Eggersglüß, Sylwester Milewski, Janusz Rajski, Jerzy Tyszer (WIiT) // IEEE Transactions on Very Large Scale Integration (VLSI) Systems - 2023, vol. 31, iss. 4, p. 411-420

Scientific article 100.0 2.8
3.

LBIST for Automotive ICs with Enhanced Test Generation / Bartosz Kaczmarek, Grzegorz Mrugalski, Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Łukasz Rybak, Jerzy Tyszer (WIiT) // IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - 2022, vol. 41, no. 7, p. 2290-2300

Scientific article 100.0 2.9
4.

Autonomous Scan Patterns for Laser Voltage Imaging / Jerzy Tyszer (WIiT), Wu-Tung Cheng, Sylwester Milewski (WIiT), Grzegorz Mrugalski, Janusz Rajski, Maciej Trawka // IEEE Transactions on Emerging Topics in Computing - 2021, vol. 9, no. 2, p. 680-691

Scientific article 140.0 6.595
5.

Time and Area Optimized Testing of Automotive ICs / Nilanjan Mukherjee, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski (WIiT), Elham Moghaddam, Janusz Rajski, Jędrzej Solecki, Jerzy Tyszer (WIiT) // IEEE Transactions on Very Large Scale Integration (VLSI) Systems - 2021, vol. 29, no. 1, p. 76-88

Scientific article 100.0 2.775

All ARTICLES

1.

Hybrid Ring Generators for In-System Test Applications / Janusz Rajski, Maciej Trawka, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // W: 2023 IEEE European Test Symposium (ETS). Proceedings: Institute of Electrical and Electronics Engineers, 2023 - p. 1-6

Chapter in monograph / paper 20.0
2.

DIST: Deterministic In-System Test with X-masking / Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // W: 2022 IEEE International Test Conference. ITC 2022. Proceedings: Institute of Electrical and Electronics Engineers Inc, 2022 - p. 20-27

Chapter in monograph / paper 20.0 70.0
3.

Hardware Root of Trust for SSN-based DFT Ecosystems / Janusz Rajski, Maciej Trawka, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // W: 2022 IEEE International Test Conference. ITC 2022. Proceedings: Institute of Electrical and Electronics Engineers Inc, 2022 - p. 450-454

Chapter in monograph / paper 20.0 70.0
4.

X-Masking for In-System Deterministic Test / Grzegorz Mrugalski, Janusz Rajski, Jerzy Tyszer (WIiT), Bartosz Włodarczak (WIiT) // W: Proceedings of the IEEE European Test Symposium 2022: IEEE, 2022 - p. [1]-[6]

Chapter in monograph / paper 20.0
5.

Convolutional Compaction-Based MRAM Fault Diagnosis / Bartosz Grzelak (WIiT), Martin Keim, Artur Pogiel, Janusz Rajski, Jerzy Tyszer (WIiT) // W: IEEE European Test Symposium (ETS) 2021: IEEE, 2021

Chapter in monograph / paper 20.0

All CHAPTERS

1.

Metoda automatycznej generacji sekwencji testujących układy cyfrowe uwzględniająca konstrukcję podzespołu elektronicznego / Janusz Rajski / prom. Zbigniew Kierzkowski, rev. Zdzisław Kachlicki (WE), Krzysztof Sapiecha - Poznań, Polska, 1982 - 108 s.

Dissertation

1.

Test compression bandwidth management in system-on-a-chip designs / Jakub Remigiusz Janicki (WEiT) / prom. Jerzy Tyszer (WEiT), Janusz Rajski, rev. Krishnendu Chakrabarty, Andrzej Kraśniewski - Poznań, Polska, 2014 - 116 s.

Dissertation
2.

Low Power Test Application with Selective Compaction in VLSI Designs / Dariusz Czysz (WEiT) / prom. Jerzy Tyszer (WEiT), Janusz Rajski, rev. Marek Domański (WEiT), Hans-Joachim Wunderlich, Andrzej Kraśniewski - Poznań, Polska, 2010 - 133 s.

Dissertation
3.

Fault Diagnosis in Design with Convolutional Compactors / Artur Pogiel / prom. Janusz Rajski, Jerzy Tyszer (WEiT), rev. Sybille Hellebrand, Andrzej Kraśniewski, Krzysztof Wesołowski (WEiT) - Poznań, Polska, 2008 - 101 s.

Dissertation

All DISSERTATIONS

1.

Trajectory-Optimized Test Pattern Generation for Built-In Self-Test / Jerzy Tyszer (WIiT), Janusz Rajski, Grzegorz Mrugalski, Łukasz Rybak, Nilanjan Mukherjee // 3/Z/2023

Invention
2.

Deterministic Stellar built-in self test / Jerzy Tyszer (WIiT), Janusz Rajski, Yjingdi Liu, Nijanjan Mukherjee // 2/Z/2023

Invention
3.

Flexible isometric decompressor architecture for test compression / Janusz Rajski, Yu Huang, Sylwester Milewski, Jerzy Tyszer (WIiT) // 0117

Invention
4.

Test Application Time Reduction Using Capture-Per-Cycle Test Points / Janusz Rajski, Sylwester Milewski, Nilanjan Mukherje, Jędrzej Solecki, Jerzy Tyszer (WIiT), Justyna Zawada // 0100

Invention
5.

MULTI-STAGE TEST RESPONSE COMPACTORS / Jerzy Tyszer (WIiT), Janusz Rajski, Grzegorz Mrugalski, Mark Kassab, Wu-Tung Cheng // 0057

Invention

All OUTCOMES

System created by Poznań University of Technology and Poznan Supercomputing and Networking Center

Scientific Information System of the Poznań University of Technology

Former employee of the Poznań University of Technology

Janusz Rajski

Articles (26)

Chapters (36)

Dissertation

Doctoral supervisor of doctoral dissertations (3)

IP outcomes (14)