Title
Hardware Protection via Logic Locking Test Points
Authors
[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee | [ D ] phd student
Scientific discipline (Law 2.0)
Year of publication
2018
Article type
scientific article
Publication language
english
Keywords
EN
- design for testability
- embedded test
- hardware security
- logic locking
- scan-based testing
- test points
Date of online publication
02.02.2018
Pages (from - to)
3020 - 3030
Ministry points / journal
25
Ministry points / journal in years 2017-2021
25
Impact Factor
2,402
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