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Main page / People / Nilanjan Mukherjee

Person from outside the Poznań University of Technology
All publications

Nilanjan Mukherjee

Articles  |  Chapters  |  IP outcomes

Articles (18)

  • 1.
    LBIST for Automotive ICs with Enhanced Test Generation / Bartosz Kaczmarek, Grzegorz Mrugalski, Nilanjan Mukherjee, Artur Pogiel, Janusz Rajski, Łukasz Rybak, Jerzy Tyszer (WIiT) // IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - 2022, vol. 41, no. 7, p. 2290-2300

    Scientific article 100
  • 2.
    Time and Area Optimized Testing of Automotive ICs / Nilanjan Mukherjee, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski (WIiT), Elham Moghaddam, Janusz Rajski, Jędrzej Solecki, Jerzy Tyszer (WIiT) // IEEE Transactions on Very Large Scale Integration (VLSI) Systems - 2021, vol. 29, no. 1, p. 76-88

    Scientific article 100
  • 3.
    Deterministic Stellar BIST for Automotive ICs / Yingdi Liu, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer (WIiT) // IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - 2020, vol. 39, no. 8, p. 1699-1710

    Scientific article 100
  • 4.
    Logic BIST with capture-per-clock hybrid test points / Elham Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jędrzej Solecki, Jerzy Tyszer (WEiT), Justyna Zawada // IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - 2019, vol. 38, no. 6, p. 1028-1041

    Scientific article 100
  • 5.
    Hardware Protection via Logic Locking Test Points / Michael Chen, Elham Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer (WEiT), Justyna Zawada (WEiT) // IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - 2018, vol. 37, no. 12, p. 3020-3030

    Scientific article 25
All ARTICLES

Chapters (16)

  • 1.
    Test Sequence-Optimized BIST for Automotive Applications / Bartosz Kaczmarek, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Łukasz Rybak, Jerzy Tyszer (WIiT) // W: IEEE European Test Symposium (ETS) 2020: IEEE, 2020

    Chapter in monograph / paper 20
  • 2.
    Test Time and Area Optimized BrST Scheme for Automotive ICs / Nilanjan Mukherjee, Daniel Tille, Mahendar Sapati, Yingdi Liu, Jeffrey Mayer, Sylwester Milewski, Elham Moghaddam, Janusz Rajski, Jędrzej Solecki, Jerzy Tyszer (WEiT) // W: IEEE International Test Conference (ITC 2019): IEEE, 2019

    Chapter in monograph / paper 20 70
  • 3.
    Deterministic Stellar BIST for in-system automotive test / Yingdi Liu, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer (WEiT) // W: 2018 IEEE International Test Conference (ITC) - New York, USA : IEEE, 2018

    Chapter in monograph / paper 20 70 15
  • 4.
    Full-Scan LBIST with Capture-per-Cycle Hybrid Test Points / Sylwester Milewski (PP), Nilanjan Mukherjee, Janusz Rajski, Jędrzej Solecki, Jerzy Tyszer (WEiT), Justyna Zawada (WEiT) // W: 2017 IEEE International Test Conference (ITC) - New York, NY, USA : IEEE, 2017 - p. 1-9

    Chapter in monograph / paper 20 70 15
  • 5.
    On Test Points Enhancing Hardware Security / Elham Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer (WEiT), Justyna Zawada (WEiT) // W: 2016 IEEE 25th Asian Test Symposium (ATS) - Los Alamitos, United States : IEEE, 2016 - p. 61-66

    Paper 15
All CHAPTERS

IP outcomes (8)

All OUTCOMES
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