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Article

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Title

Testing schemes for FIR filter structures

Authors

[ 1 ] Instytut Elektroniki i Telekomunikacji (IEt), Wydział Elektryczny, Politechnika Poznańska | [ P ] employee

Year of publication

2001

Published in

IEEE Transactions on Computers

Journal year: 2001 | Journal volume: vol. 50 | Journal number: iss. 7

Article type

scientific article

Publication language

english

Keywords
EN
  • complex multipliers
  • design for testability
  • FIR filters
  • pseudoexhaustive testing
  • sign-extended adders
  • cell fault model
  • state coverage
  • trees of adders
Abstract

EN This paper presents a new pseudoexhaustive test methodology for digital finite impulse response (FIR) filters. The proposed scheme can be employed to detect any combinational faults within the basic cell of the functional units occurring in linear phase comb filters, trees of sign-extended adders and phase-shift multipliers. It uses additive generators as a source of pseudo-exhaustive patterns to systematically test all FIR filter building blocks.

Pages (from - to)

674 - 688

DOI

10.1109/12.936234

URL

https://ieeexplore.ieee.org/document/936234

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