A new static compaction of deterministic test sets
[ 1 ] Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ P ] pracownik
2023
artykuł naukowy
angielski
- Automatic test pattern generation (ATPG)
- necessary assignments
- SAT-based ATPG
- static test compaction
- test data compression
EN Test set compaction is one of the key steps of the post-production test known to bring down test pattern counts. This, in turn, allows one to reduce the corresponding test data volume, test application time, and hence the cost of testing. The paper presents a method that strives to reduce the number of ATPG-produced deterministic test patterns to deliver compact test sets. In principle, the new scheme works with a meaningful representation of test patterns by using external and internal necessary assignments to determine small groups of potentially compatible faults. These faults are subsequently retargeted by the robust SAT-based ATPG that produces a single test pattern for the entire group, thus making the resultant test set smaller in size. Experimental results obtained for twelve large industrial cores and stuck-at faults confirm superiority of the proposed scheme over state-of-the-art test set compaction techniques and are reported herein.
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2,8 [Lista 2022]