SIS PUT | The Use of Optical Scanner for Analysis of Surface Defects

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Chapter

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Title

The Use of Optical Scanner for Analysis of Surface Defects

Authors

Michał Wieczorowski (WBMiZ) ^{[ 1 ][ 2.9 ][ P ]}
Bartosz Gapiński (WBMiZ) ^{[ 1 ][ 2.9 ][ P ]}
Natalia Swojak (WBMiZ) ^{[ 1 ][ 2.9 ][ P ]}

^{[ 1 ]} Instytut Technologii Mechanicznej, Wydział Budowy Maszyn i Zarządzania, Politechnika Poznańska | ^{[ P ]} employee

Scientific discipline (Law 2.0)

[2.9] Mechanical engineering

Year of publication

2019

Chapter type

chapter in monograph / paper

Publication language

english

Keywords

EN

surface defect
topography
optical scanner
mesoscale
surface treatment

Pages (from - to)

0076 - 0085

DOI

10.2507/30th.daaam.proceedings.010

URL

https://www.daaam.info/Downloads/Pdfs/proceedings/proceedings_2019/010.pdf

Book

Proceedings of the 30th International DAAAM Symposium ''Intelligent Manufacturing & Automation''

Presented on

30th DAAAM International Symposium on Intelligent Manufacturing and Automation, 23-26.10.2019, Zadar, Croatia

Ministry points / chapter

5

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