Title
Deterministic Stellar BIST for Automotive ICs
Authors
[ 1 ] Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ P ] employee
Scientific discipline (Law 2.0)
Year of publication
2020
Article type
scientific article
Publication language
english
Keywords
EN
- automotive embedded test
- functional safety
- scan-based testing
- test application time
- test data compression
Pages (from - to)
1699 - 1710
Ministry points / journal
100
Ministry points / journal in years 2017-2021
100
Impact Factor
2,807
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