Low Cost Hypercompression of Test Data

Yu Huang; Sylwester Milewski; Janusz Rajski; Jerzy Tyszer; Chen Wang

doi:10.1109/TCAD.2019.2945760

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Title

Low Cost Hypercompression of Test Data

Authors

Yu Huang
Sylwester Milewski (WIiT) ^{[ 1 ]}
Janusz Rajski
Jerzy Tyszer (WIiT) ^{[ 2 ][ 2.3 ][ P ]}
Chen Wang

^{[ 1 ]} Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | ^{[ 2 ]} Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | ^{[ P ]} employee

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

Year of publication

2020

Published in

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Journal year: 2020 | Journal volume: vol. 39 | Journal number: no. 10

Article type

scientific article

Publication language

english

Keywords

EN

design for testability
embedded test
isometric compression
scan-based testing
test data compression

Pages (from - to)

2964 - 2975

DOI

10.1109/TCAD.2019.2945760

URL

https://ieeexplore.ieee.org/document/8861091

Ministry points / journal

100

Ministry points / journal in years 2017-2021

100

Impact Factor

2,807

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