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Article

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Title

Scan integrity tests for EDT compression

Authors

[ 1 ] Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ P ] employee

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

Year of publication

2020

Published in

IEEE Design & Test

Journal year: 2020 | Journal volume: vol. 37 | Journal number: iss. 4

Article type

scientific article

Publication language

english

Pages (from - to)

21 - 26

DOI

10.1109/MDAT.2020.2968271

URL

https://ieeexplore.ieee.org/document/8963969

Ministry points / journal

70

Ministry points / journal in years 2017-2021

70

Impact Factor

1,527

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