Test response compactor with programmable selector
[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee
2006
paper
english
- compression
- scan chain selection
- unknown states
- VLSI test
EN The paper presents an efficient method for synthesis of scan chain selection logic. It is capable of acting as a flexible X-control logic for test response compactors. The same circuitry can also be employed to selectively gate scan chains for diagnostic purposes.
1089 - 1094