Title
Test response compactor with programmable selector
Authors
[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee
Year of publication
2006
Chapter type
paper
Publication language
english
Keywords
EN
- compression
- scan chain selection
- unknown states
- VLSI test
Abstract
EN The paper presents an efficient method for synthesis of scan chain selection logic. It is capable of acting as a flexible X-control logic for test response compactors. The same circuitry can also be employed to selectively gate scan chains for diagnostic purposes.
Pages (from - to)
1089 - 1094
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