Title
2D test sequence generators
Authors
[ 1 ] Instytut Elektroniki i Telekomunikacji (IEt), Wydział Elektryczny, Politechnika Poznańska | [ P ] employee
Year of publication
2003
Published in
Article type
scientific article
Publication language
english
Abstract
EN In experiments examining test pattern generators using LFSRs with and without phase shifters as sources of 2D stimuli, generators with phase shifters consistently achieved higher hit ratios than those without them. Moreover, a new algorithm synthesizes phase shifters, minimizes linear dependencies, and highly balances the use of generator stages.
Pages (from - to)
51 - 59
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