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Article

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Title

High resolution surface analysis of Si roughening in dilute ammonium fluoride solution

Authors

[ 1 ] Instytut Inżynierii Materiałowej, Wydział Budowy Maszyn i Zarządzania, Politechnika Poznańska | [ P ] employee

Year of publication

2003

Published in

Journal of Electroanalytical Chemistry

Journal year: 2003 | Journal volume: vol. 540

Article type

scientific article

Publication language

english

Pages (from - to)

3 - 6

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