Title
2016 IEEE 25th Asian Test Symposium (ATS)
Year of publication
2016
Book type
conference proceedings
Publication language
english
Place
Los Alamitos, United States
Publisher name
Publisher name from the Ministry list
Institute of Electrical and Electronics Engineers (IEEE)
Date of publication
2016
ISBN
978-1-5090-3809-1
Published in
Book series: Asian Test Symposium Proceedings
Publication indexed in
WoS (15)
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