On New Test Points for Compact Cell-Aware Tests

Cesar Acero; Derek Feltham; Marek Patyra; Friedrich Hapke; Elham Moghaddam; Nilanjan Mukherjee; Vidya Neerkundar; Janusz Rajski; Jerzy Tyszer; Justyna Zawada

doi:10.1109/MDAT.2016.2590980

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Title

On New Test Points for Compact Cell-Aware Tests

Authors

^{[ 1 ]} Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | ^{[ 2 ]} Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | ^{[ P ]} employee | ^{[ D ]} phd student

Year of publication

2016

Published in

IEEE Design & Test

Journal year: 2016 | Journal volume: vol. 33 | Journal number: iss. 6

Article type

scientific article

Publication language

english

Keywords

EN

circuit faults
logic gates
automatic test pattern generation
correlation
controllability
process control

Abstract

EN Test points are known to improve the fault coverage in BIST applications. This article discusses a new class of test points used to improve the ATPG pattern count in designs that employ embedded deterministic test.

Pages (from - to)

7 - 14

DOI

10.1109/MDAT.2016.2590980

URL

https://ieeexplore.ieee.org/document/7511668

Ministry points / journal

30

Impact Factor

1,366

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