On New Test Points for Compact Cell-Aware Tests
[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ 2 ] Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee | [ D ] phd student
2016
scientific article
english
- circuit faults
- logic gates
- automatic test pattern generation
- correlation
- controllability
- process control
EN Test points are known to improve the fault coverage in BIST applications. This article discusses a new class of test points used to improve the ATPG pattern count in designs that employ embedded deterministic test.
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