SIS PUT | Szkolenie "Optyczne systemy pomiarowe"

Depending on the amount of data to process, file generation may take longer.

If it takes too long to generate, you can limit the data by, for example, reducing the range of years.

Menu

Scientific Information System of the Poznań University of Technology

PL EN

Main page / Reports / Szkolenie "Optyczne systemy pomiarowe"

Submit a comment

Report

Works title

Szkolenie "Optyczne systemy pomiarowe"

Authors

Michał Jakubowicz (WIM) ^{[ 1 ][ P ]}
Lidia Marciniak-Podsadna (WIM) ^{[ 1 ][ P ]}
Michał Wieczorowski (WIM) ^{[ 1 ][ P ]}

^{[ 1 ]} Instytut Technologii Mechanicznej, Wydział Inżynierii Mechanicznej, Politechnika Poznańska | ^{[ P ]} employee

Work ID

r3234_2022

Keywords

PL

skanowanie 3D
fotogrametria
technika współrzędnościowa

Date

12.09.2022

Language

polish

Number of pages or volume of work

117

Type of work

educational materials

System created by Poznań University of Technology and Poznan Supercomputing and Networking Center

Log in through eKonto to add to SIS

This website uses cookies to remember the authenticated session of the user. For more information, read about Cookies and Privacy Policy.