Title
Embedded Deterministic Test Points
Authors
[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee | [ D ] phd student
Scientific discipline (Law 2.0)
Year of publication
2017
Article type
scientific article
Publication language
english
Keywords
EN
- design for testability
- embedded test
- scan-based testing
- test application time
- test data compression
- test points
Pages (from - to)
2949 - 2961
Ministry points / journal
30
Ministry points / journal in years 2017-2021
30
Impact Factor
1,744
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