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Article

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Title

Embedded Deterministic Test Points

Authors

[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee | [ D ] phd student

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

Year of publication

2017

Published in

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Journal year: 2017 | Journal volume: vol. 25 | Journal number: no. 10

Article type

scientific article

Publication language

english

Keywords
EN
  • design for testability
  • embedded test
  • scan-based testing
  • test application time
  • test data compression
  • test points
Pages (from - to)

2949 - 2961

DOI

10.1109/TVLSI.2017.2717844

Ministry points / journal

30

Ministry points / journal in years 2017-2021

30

Impact Factor

1,744

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