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Article

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Title

Star-EDT: Deterministic on-chip scheme using compressed test patterns

Authors

[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

Year of publication

2017

Published in

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Journal year: 2017 | Journal volume: vol. 36 | Journal number: no. 4

Article type

scientific article

Publication language

english

Keywords
EN
Pages (from - to)

683 - 693

DOI

10.1109/TCAD.2016.2597214

URL

https://doi.org/10.1109/TCAD.2016.2597214

Ministry points / journal

25

Ministry points / journal in years 2017-2021

25

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