Title
The Use of Optical Scanner for Analysis of Surface Defects
Authors
[ 1 ] Instytut Technologii Mechanicznej, Wydział Budowy Maszyn i Zarządzania, Politechnika Poznańska | [ P ] employee
Scientific discipline (Law 2.0)
Year of publication
2019
Chapter type
chapter in monograph / paper
Publication language
english
Keywords
EN
- surface defect
- topography
- optical scanner
- mesoscale
- surface treatment
Pages (from - to)
0076 - 0085
Ministry points / chapter
5.0
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