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Article


Title

Deterministic Stellar BIST for Automotive ICs

Authors

[ 1 ] Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ P ] employee

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

Year of publication

2020

Published in

IEEE Transactions on Computer Aided Design of Integrated Circuits and Systems

Journal year: 2020 | Journal volume: vol. 39 | Journal number: no. 8

Article type

scientific article

Publication language

english

Keywords
EN
  • automotive embedded test
  • functional safety
  • scan-based testing
  • test application time
  • test data compression
Pages (from - to)

1699 - 1710

DOI

10.1109/TCAD.2019.2925353

URL

https://doi.org/10.1109/TCAD.2019.2925353

Points of MNiSW / journal

100.0

Points of MNiSW / journal in years 2017-2021

100.0

Impact Factor

2.807