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Article


Title

Autonomous Scan Patterns for Laser Voltage Imaging

Authors

[ 1 ] Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ 2 ] Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ P ] employee | [ D ] phd student

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

Year of publication

2021

Published in

IEEE Transactions on Emerging Topics in Computing

Journal year: 2021 | Journal volume: vol. 9 | Journal number: no. 2

Article type

scientific article

Publication language

english

Keywords
EN
  • E-beam test
  • laser voltage imaging
  • logic BIST
  • repeated scan integrity tests
  • scan cell diagnosis
  • test compression
Pages (from - to)

680 - 691

DOI

10.1109/TETC.2019.2944590

URL

https://ieeexplore.ieee.org/document/8859228

Points of MNiSW / journal

140.0

Points of MNiSW / journal in years 2017-2021

140.0

Impact Factor

7.691 [List 2020]