Autonomous Scan Patterns for Laser Voltage Imaging

Jerzy Tyszer; Wu-Tung Cheng; Sylwester Milewski; Grzegorz Mrugalski; Janusz Rajski; Maciej Trawka

doi:10.1109/TETC.2019.2944590

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Title

Autonomous Scan Patterns for Laser Voltage Imaging

Authors

Jerzy Tyszer (WIiT) ^{[ 1 ][ 2.3 ][ P ]}
Wu-Tung Cheng
Sylwester Milewski (WIiT) ^{[ 2 ][ D ]}
Grzegorz Mrugalski
Janusz Rajski
Maciej Trawka

^{[ 1 ]} Instytut Radiokomunikacji, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | ^{[ 2 ]} Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | ^{[ P ]} employee | ^{[ D ]} phd student

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

Year of publication

2021

Published in

IEEE Transactions on Emerging Topics in Computing

Journal year: 2021 | Journal volume: vol. 9 | Journal number: no. 2

Article type

scientific article

Publication language

english

Keywords

EN

E-beam test
laser voltage imaging
logic BIST
repeated scan integrity tests
scan cell diagnosis
test compression

Pages (from - to)

680 - 691

DOI

10.1109/TETC.2019.2944590

URL

https://ieeexplore.ieee.org/document/8859228

Ministry points / journal

140

Ministry points / journal in years 2017-2021

140

Impact Factor

6,595

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