A novel approach to using artificial intelligence in coordinate metrology including nano scale
[ 1 ] Instytut Technologii Mechanicznej, Wydział Inżynierii Mechanicznej, Politechnika Poznańska | [ 2 ] Instytut Informatyki, Wydział Informatyki i Telekomunikacji, Politechnika Poznańska | [ P ] pracownik
[2.3] Informatyka techniczna i telekomunikacja[2.9] Inżynieria mechaniczna
2023
artykuł naukowy
angielski
- Artificial intelligence
- Metrology
- Scale
- Scanning
- Nano
EN The applications of modern length and angle metrology continue to pose new challenges for manufacturers and operators of measuring equipment, starting from nano scale. One method to support measurement processes is the use of artificial intelligence. As an essential part of Industry 4.0 and Metrology 4.0 strategies, it actively supports humans in executing measurement activities. The use of artificial intelligence in this area is determined by technological and social factors, as the shortage of highly skilled operators is becoming increasingly acute. The paper discusses the possibilities of using artificial intelligence in coordinate metrology. Ideas including the selection of the measurement strategy, conditions, filtering techniques, as well as self-verification or even self-calibration were presented. Schemes of procedures using local and global databases of applications and measuring instruments are presented. A new area application in the analysis of interference fringes is shown, with method descriptions and experimental results.
18.05.2023
113051-1 - 113051-11
Article Number: 113051
200
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