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Article

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Title

High-temperature Thermal Stability of a Graphene Hall Effect Sensor on Defect-engineered 4H-SiC(0001)

Authors

[ 1 ] Instytut Fizyki, Wydział Inżynierii Materiałowej i Fizyki Technicznej, Politechnika Poznańska | [ P ] employee

Scientific discipline (Law 2.0)

[2.8] Materials engineering

Year of publication

2024

Published in

IEEE Electron Device Letters

Journal year: 2024 | Journal volume: vol. 45 | Journal number: iss. 10

Article type

scientific article

Publication language

english

Keywords
EN
  • Graphene
  • SiC
  • Hall effect sensor
Abstract

EN In this letter, we demonstrate a Hall effect sensor in the technology of amorphous-Al2O3-passivated transfer-free p-type hydrogen-intercalated quasi-free-standing epitaxial Chemical Vapor Deposition graphene on semi-insulating high-purity on-axis 4H-SiC(0001), pre-epitaxially modified with 5-keV hydrogen (H+) ions. The sensor operates between 305 K and 770 K, with a current-mode sensitivity of ~75 V/AT and thermal stability below 0.15 %/K ( ⩽ 0.03 %/K in a narrower range between 305 K and 700 K). It is a promising two-dimensional platform for high-temperature magnetic diagnostics and plasma control systems for modern tokamak fusion reactors.

Pages (from - to)

1957 - 1960

DOI

10.1109/LED.2024.3436050

Ministry points / journal

140

Impact Factor

4,5

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