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Article

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Title

On New Test Points for Compact Cell-Aware Tests

Authors

[ 1 ] Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee | [ D ] phd student

Year of publication

2016

Published in

IEEE Design & Test

Journal year: 2016 | Journal volume: vol. 33 | Journal number: iss. 6

Article type

scientific article

Publication language

english

Keywords
EN
  • circuit faults
  • logic gates
  • automatic test pattern generation
  • correlation
  • controllability
  • process control
Pages (from - to)

7 - 14

DOI

10.1109/MDAT.2016.2590980

Ministry points / journal

30

Impact Factor

1,366

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