Bandwidth-aware test compression logic for SoC designs
[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee
2012
paper
english
- channel bandwidth management
- embedded deterministic test
- scan-based designs
- test data compression
EN This paper presents novel methods of enhancing test compression solutions for SoC designs. The ability of the proposed schemes to improve the encoding efficiency, test compression, and test time is accomplished by either appropriate selecting or laying out ATE channel injectors within EDT-based decompressors. The efficacy of new techniques with respect to test bandwidth management is demonstrated by running experiments on several industrial SoC designs and is reported herein.
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