Title
Staggered ATPG with capture-per-cycle observation test points
Authors
[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee
Scientific discipline (Law 2.0)
Year of publication
2018
Chapter type
chapter in monograph / paper
Publication language
english
Keywords
EN
- ATPG
- deterministic test patterns
- test point insertion
- staggered test patterns
- test-per-clock
- test-per-scan
Ministry points / chapter
20
Publication indexed in
WoS (15)
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