Hypercompression of test patterns

Yu Huang; Sylwester Milewski; Janusz Rajski; Jerzy Tyszer; Chen Wang

doi:10.1109/TEST.2018.8624868

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Title

Hypercompression of test patterns

Authors

Yu Huang
Sylwester Milewski (WEiT) ^{[ 1 ]}
Janusz Rajski
Jerzy Tyszer (WEiT) ^{[ 2 ][ 2.3 ][ P ]}
Chen Wang

^{[ 1 ]} Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | ^{[ 2 ]} Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | ^{[ P ]} employee

Scientific discipline (Law 2.0)

[2.3] Information and communication technology

Year of publication

2018

Chapter type

chapter in monograph / paper

Publication language

english

Date of online publication

24.01.2019

DOI

10.1109/TEST.2018.8624868

Book

2018 IEEE International Test Conference (ITC)

Presented on

49th IEEE International Test Conference (ITC), 29.10.2018 - 01.11.2018, Phoenix, USA

Ministry points / chapter

20

Ministry points / conference (CORE)

70

Publication indexed in

WoS (15)

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