Title
On cyclic scan integrity tests for EDT-based compression
Authors
[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee
Scientific discipline (Law 2.0)
Year of publication
2019
Chapter type
chapter in monograph / paper
Publication language
english
Keywords
EN
- E-beam test
- laser voltage imaging
- logic BIST
- repeated scan integrity tests
- scan cell diagnosis
- test compression
Ministry points / chapter
20
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