Title
Application of XPS technique to the characterisation of silica surface modified using selected ionic liquids
Authors
[ 1 ] Instytut Technologii i Inżynierii Chemicznej, Wydział Technologii Chemicznej, Politechnika Poznańska | [ P ] employee
Year of publication
2005
Chapter type
paper
Publication language
english
Pages (from - to)
591 - 594
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