Title
High performance dense ring generators
Authors
[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee
Year of publication
2006
Published in
Article type
scientific article
Publication language
english
Keywords
EN
- built-in self-test
- design for testability
- linear feedback shift registers
- phase shifters
- ring generators
Abstract
EN This paper presents an enhanced architecture of on-chip pseudorandom test pattern generators, test data decompressors, and test response compactors based on ring generators. The new structure is aimed at improving layout and routing properties while, at the same time, reducing propagation delays introduced by associated phase shifters.
Pages (from - to)
83 - 87
Impact Factor
1,426
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