New test compression scheme based on low power BIST
[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] pracownik
2013
referat
angielski
- built-in self-test
- hybrid low power compression
- low power test
- test data compression
- scan-based test
- toggling
EN This paper describes a new programmable low power test compression method that allows shaping the test power envelope in a fully predictable, accurate, and flexible fashion by adapting the existing logic BIST infrastructure. The proposed hybrid scheme efficiently combines test compression with logic BIST, where both techniques can work synergistically to deliver high quality test. Experimental results obtained for industrial designs illustrate feasibility of the proposed test scheme and are reported herein.
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