Depending on the amount of data to process, file generation may take longer.

If it takes too long to generate, you can limit the data by, for example, reducing the range of years.

Chapter

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Title

New test compression scheme based on low power BIST

Authors

[ 1 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ P ] employee

Year of publication

2013

Chapter type

paper

Publication language

english

Pages (from - to)

1 - 6

DOI

10.1109/ETS.2013.6569374

Book

18th IEEE European Test Symposium (ETS 2013), Avignon, 27-30 May 2013

Presented on

18th IEEE European Test Symposium (ETS 2013), 27-30.05.2013, Avignon, France

Publication indexed in

WoS (15)

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