Depending on the amount of data to process, file generation may take longer.

If it takes too long to generate, you can limit the data by, for example, reducing the range of years.

Article

Download BibTeX

Title

Scan Test Bandwidth Management for Ultralarge-Scale System-on-Chip Architectures

Authors

[ 1 ] Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ 2 ] Katedra Radiokomunikacji, Wydział Elektroniki i Telekomunikacji, Politechnika Poznańska | [ D ] phd student | [ P ] employee

Year of publication

2015

Published in

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Journal year: 2015 | Journal volume: vol. 23 | Journal number: no. 6

Article type

scientific article

Publication language

english

Keywords
EN
  • Bandwidth management
  • embedded deterministic test (EDT)
  • scan-based test
  • test access mechanism (TAM)
  • test application time
  • test compression
  • test scheduling
Pages (from - to)

1050 - 1062

DOI

10.1109/TVLSI.2014.2332469

Ministry points / journal

30

Impact Factor

1,245

This website uses cookies to remember the authenticated session of the user. For more information, read about Cookies and Privacy Policy.