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Main page / People / Mark Kassab

Person from outside the Poznań University of Technology
All publications

Mark Kassab

Articles  |  Chapters  |  IP outcomes

Articles (7)

  • 1.
    Isometric Test Data Compression / Amit Kumar, Mark Kassab, Elham Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer (WEiT), Chen Wang // IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - 2015, vol. 34, no. 11, p. 1847-1859

    Scientific article 25
  • 2.
    Scan test bandwidth management for ultra-large-scale multicore architectures / Wu-Tung Cheng, Yan Dong, Grady Gilles, Yu Huang, Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer (WEiT) // IEEE Transactions on Very Large Scale Integration (VLSI) Systems - 2015, vol. 23, no. 6, p. 1050-1062

    Scientific article 30
  • 3.
    Scan Test Bandwidth Management for Ultralarge-Scale System-on-Chip Architectures / Wu-Tung Cheng, Yan Dong, Grady Gilles, Yu Huang, Jakub Janicki (WEiT), Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer (WEiT) // IEEE Transactions on Very Large Scale Integration (VLSI) Systems - 2015, vol. 23, no. 6, p. 1050-1062

    Scientific article 30
  • 4.
    Test Time Reduction in EDT Bandwidth Management for SoC Designs / Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer (WEiT) // IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - 2013, vol. 32, no. 11, p. 1776-1786

    Scientific article 25
  • 5.
    EDT Bandwidth Management in SoC Designs / Jakub Janicki, Mark Kassab, Grzegorz Mrugalski, Nilanjan Mukherjee, Janusz Rajski, Jerzy Tyszer (WEiT) // IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems - 2012, vol. 31, no. 12, p. 1894-1907

    Scientific article
All ARTICLES

Chapters (4)

  • 1.
    Isometric test compression with low toggling activity / Amit Kumar, Mark Kassab, Elham Moghaddam, Nilanjan Mukherjee, Janusz Rajski, Sudhakar M. Reddy, Jerzy Tyszer (WEiT), Chen Wang // W: 2014 IEEE International Test Conference (ITC), Seattle, WA, 20-23 Oct. 2014: IEEE, 2014 - p. 1-7

    Paper
  • 2.
    EDT bandwidth management - Practical scenarios for large SoC designs / Jakub Janicki, Jerzy Tyszer (WEiT), Wu-Tung Cheng, Yu Huang, Mark Kassab, Nilanjan Mukherjee, Janusz Rajski, Yan Dong, Grady Giles // W: IEEE International Test Conference (ITC 2013), Anaheim, CA, 6-13 September, 2013: IEEE, 2013 - p. 1-10

    Paper 15
  • 3.
    X-press compactor for 1000x reduction of test data / Janusz Rajski, Jerzy Tyszer (WEiT), Grzegorz Mrugalski, Nilanjan Mukherjee, Wu-Tung Cheng, Mark Kassab // W: IEEE International Test Conference ITC 2006 : Santa Clara, 22-27 October 2006: IEEE, 2006 - p. 18.1-1-18.1-10

    Paper
  • 4.
    Embedded deterministic test for low cost manufacturing test / Janusz Rajski, Jerzy Tyszer (WE), Mark Kassab, Nilanjan Mukherjee, Rob Thompson, Kun-Han Tsai, Andre Hertwig, Nagesh Tamarapalli, Grzegorz Mrugalski (WE), Geir Eide, Jun Qian // W: Proceedings International Test Conference 2002 - Piscataway, United States : IEEE, 2002 - p. 301-310

    Paper
All CHAPTERS

IP outcomes (7)

All OUTCOMES
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